electron microscopy electron backscattered diffraction pattern sem ebsd method Search Results


aztec electron backscatter diffraction ebsd detector  (Oxford Instruments)
99
Oxford Instruments aztec electron backscatter diffraction ebsd detector
Aztec Electron Backscatter Diffraction Ebsd Detector, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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hitachi h7650 transmission electron microscopy  (Hitachi Ltd)
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Hitachi Ltd hitachi h7650 transmission electron microscopy
Hitachi H7650 Transmission Electron Microscopy, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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jem 2100 transmission electron microscopy tem  (JEOL)
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JEOL jem 2100 transmission electron microscopy tem
Jem 2100 Transmission Electron Microscopy Tem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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high resolution transmission electron microscopy hrtem  (JEOL)
99
JEOL high resolution transmission electron microscopy hrtem
(a) and (b) TEM and <t>HRTEM</t> images of the Mo-NCO nanocrystals. (c) STEM image of the Mo-NCO nanocrystals. (d)–(g) Elemental mapping exhibiting the presence of Ni, Co, Mo, and O. (h) SEM image of the Mo-NCO nanocrystals. (i) EDS spectrum of Mo-NCO.
High Resolution Transmission Electron Microscopy Hrtem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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xray diffraction  (JEOL)
97
JEOL xray diffraction
(a) and (b) TEM and <t>HRTEM</t> images of the Mo-NCO nanocrystals. (c) STEM image of the Mo-NCO nanocrystals. (d)–(g) Elemental mapping exhibiting the presence of Ni, Co, Mo, and O. (h) SEM image of the Mo-NCO nanocrystals. (i) EDS spectrum of Mo-NCO.
Xray Diffraction, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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diffraction  (JEOL)
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JEOL diffraction
(a) and (b) TEM and <t>HRTEM</t> images of the Mo-NCO nanocrystals. (c) STEM image of the Mo-NCO nanocrystals. (d)–(g) Elemental mapping exhibiting the presence of Ni, Co, Mo, and O. (h) SEM image of the Mo-NCO nanocrystals. (i) EDS spectrum of Mo-NCO.
Diffraction, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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diffraction - by Bioz Stars, 2026-10
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electron backsc tter d diffraction ebsd  (JEOL)
97
JEOL electron backsc tter d diffraction ebsd
Figure 6. Euler angle colored electron backscattered <t>diffraction</t> <t>(EBSD)</t> maps of T6 state of (a) 1-Hom. alloy A(0.1Zr); (b) 1-Hom. alloy B(0.05Sc); (c) 2-Hom. alloy A(0.1Zr); (d) 2-Hom. alloy B(0.05Sc); (e) IPF(Inverse Pole Figure) coloring map and cross-sectional direction. ND, normal direction; RD, rolling direction.
Electron Backsc Tter D Diffraction Ebsd, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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htrem  (JEOL)
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JEOL htrem
Figure 6. Euler angle colored electron backscattered <t>diffraction</t> <t>(EBSD)</t> maps of T6 state of (a) 1-Hom. alloy A(0.1Zr); (b) 1-Hom. alloy B(0.05Sc); (c) 2-Hom. alloy A(0.1Zr); (d) 2-Hom. alloy B(0.05Sc); (e) IPF(Inverse Pole Figure) coloring map and cross-sectional direction. ND, normal direction; RD, rolling direction.
Htrem, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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microscopy suite v1 7 software  (Gatan Inc)
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Gatan Inc microscopy suite v1 7 software
Figure 6. Euler angle colored electron backscattered <t>diffraction</t> <t>(EBSD)</t> maps of T6 state of (a) 1-Hom. alloy A(0.1Zr); (b) 1-Hom. alloy B(0.05Sc); (c) 2-Hom. alloy A(0.1Zr); (d) 2-Hom. alloy B(0.05Sc); (e) IPF(Inverse Pole Figure) coloring map and cross-sectional direction. ND, normal direction; RD, rolling direction.
Microscopy Suite V1 7 Software, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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k3 summit direct electron detector  (Gatan Inc)
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Gatan Inc k3 summit direct electron detector
Figure 6. Euler angle colored electron backscattered <t>diffraction</t> <t>(EBSD)</t> maps of T6 state of (a) 1-Hom. alloy A(0.1Zr); (b) 1-Hom. alloy B(0.05Sc); (c) 2-Hom. alloy A(0.1Zr); (d) 2-Hom. alloy B(0.05Sc); (e) IPF(Inverse Pole Figure) coloring map and cross-sectional direction. ND, normal direction; RD, rolling direction.
K3 Summit Direct Electron Detector, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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photoelectron emission microscopy (peem)  (ELMITEC Elektronenmikroskopie GmbH)
90
ELMITEC Elektronenmikroskopie GmbH photoelectron emission microscopy (peem)
Figure 6. Euler angle colored electron backscattered <t>diffraction</t> <t>(EBSD)</t> maps of T6 state of (a) 1-Hom. alloy A(0.1Zr); (b) 1-Hom. alloy B(0.05Sc); (c) 2-Hom. alloy A(0.1Zr); (d) 2-Hom. alloy B(0.05Sc); (e) IPF(Inverse Pole Figure) coloring map and cross-sectional direction. ND, normal direction; RD, rolling direction.
Photoelectron Emission Microscopy (Peem), supplied by ELMITEC Elektronenmikroskopie GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscatter diffraction ebsd microscope edax velocity super  (Gatan Inc)
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Gatan Inc electron backscatter diffraction ebsd microscope edax velocity super
Figure 13. Microstructure characteristics: (a–d) <t>EBSD</t> inverse pole figure orientation maps for thin walls with thickness of 0.4~1.0 mm, (e) grain size, (f) aspect ratio, (g) grain orientation.
Electron Backscatter Diffraction Ebsd Microscope Edax Velocity Super, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


(a) and (b) TEM and HRTEM images of the Mo-NCO nanocrystals. (c) STEM image of the Mo-NCO nanocrystals. (d)–(g) Elemental mapping exhibiting the presence of Ni, Co, Mo, and O. (h) SEM image of the Mo-NCO nanocrystals. (i) EDS spectrum of Mo-NCO.

Journal: RSC Advances

Article Title: Mesoporous Mo-doped NiCo 2 O 4 nanocrystals for enhanced electrochemical kinetics in high-performance lithium-ion batteries †

doi: 10.1039/d5ra00918a

Figure Lengend Snippet: (a) and (b) TEM and HRTEM images of the Mo-NCO nanocrystals. (c) STEM image of the Mo-NCO nanocrystals. (d)–(g) Elemental mapping exhibiting the presence of Ni, Co, Mo, and O. (h) SEM image of the Mo-NCO nanocrystals. (i) EDS spectrum of Mo-NCO.

Article Snippet: High-resolution transmission electron microscopy (HRTEM) and elemental mapping were performed using a JEOL JEM-2100F system at 200 kV.

Techniques:

Figure 6. Euler angle colored electron backscattered diffraction (EBSD) maps of T6 state of (a) 1-Hom. alloy A(0.1Zr); (b) 1-Hom. alloy B(0.05Sc); (c) 2-Hom. alloy A(0.1Zr); (d) 2-Hom. alloy B(0.05Sc); (e) IPF(Inverse Pole Figure) coloring map and cross-sectional direction. ND, normal direction; RD, rolling direction.

Journal: Applied Sciences

Article Title: The Effects of Multi-Stage Homogenizations on the Microstructures and Mechanical Properties of Al–Zn–Mg–Zr–Sc Alloys

doi: 10.3390/app11020470

Figure Lengend Snippet: Figure 6. Euler angle colored electron backscattered diffraction (EBSD) maps of T6 state of (a) 1-Hom. alloy A(0.1Zr); (b) 1-Hom. alloy B(0.05Sc); (c) 2-Hom. alloy A(0.1Zr); (d) 2-Hom. alloy B(0.05Sc); (e) IPF(Inverse Pole Figure) coloring map and cross-sectional direction. ND, normal direction; RD, rolling direction.

Article Snippet: An optical microscope (OM, Olympus BX60M), a field emission scanning transmission electr n microsc pe (TEM, ULTRA-HRTEM, JEOL JEM-ARM200FTH) and a field emission gun scanning electron microscope (Thermal Field Emission Scanning Electron Microscope (FEG-SEM) + electron backsc tter d diffraction (EBSD), JEOL JSM-7800F Prime) were utilized to observe the microstructures.

Techniques:

Figure 13. Microstructure characteristics: (a–d) EBSD inverse pole figure orientation maps for thin walls with thickness of 0.4~1.0 mm, (e) grain size, (f) aspect ratio, (g) grain orientation.

Journal: Metals

Article Title: Effect of Feature Size on Defects, Microstructure, and Mechanical Properties of Selective Laser Melted AlSi10Mg Lattice Structure

doi: 10.3390/met15010077

Figure Lengend Snippet: Figure 13. Microstructure characteristics: (a–d) EBSD inverse pole figure orientation maps for thin walls with thickness of 0.4~1.0 mm, (e) grain size, (f) aspect ratio, (g) grain orientation.

Article Snippet: An electron backscatter diffraction (EBSD) microscope EDAX Velocity Super (EDAX Inc., Pennsylvania, PA, USA) was used to characterize the microstructure.

Techniques: